A comparison of vertical scanning interferometry (VSI) and atomic force microscopy (AFM) for characterizing membrane surface topography
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چکیده
In this paper, vertical scanning interferometry (VSI) and atomic force microscopy (AFM) were used to characterize the topography of several nanofiltration and reverse osmosis membrane surfaces. Comparing roughness results from the two different characterization techniques revealed u f o a m ©
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تاریخ انتشار 2006